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. 2024 Sep 18;17(18):4585. doi: 10.3390/ma17184585

Table 1.

Plasma etching conditions used in the present work.

Parameter Condition
Top RF power (W) 900
Bottom RF power (W) 200
C4F6 (Sccm) 30
Ar (Sccm) 60
O2 (Sccm) 15
Pressure (mTorr) 10
Operating time (h) 1