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. 2024 Aug 24;15(9):244. doi: 10.3390/jfb15090244

Figure 1.

Figure 1

Surface analysis of an unused Dual Top Anchor System implant. (a) Overview aspect seen by optical microscopy, 10×. (b) SEM aspect of the cervical half, Z1-Z2 areas. (c) SEM aspect of the apical half, Z2-Z4 areas. (d) SEM aspect of the cervical half, Z1-Z2 areas with measurements. (e) EDX analysis of the implant surface. (f) Percentage elemental analysis from the implant surface.