TABLE 1.
Microscopy and image reconstruction data
| Sample | Microscopeb (voltage) | Magnification | No. of micrograph pairs | Pixel size (Å) | Particle imagesc | CTF correctiond | Resolution (Å)e | EMDB IDf |
|---|---|---|---|---|---|---|---|---|
| 135S1 | Tecnai 20 (200 kV) | 50,000 | 22 | 2.7 | 3,641 | CTFMIX | 11 | 3139 |
| 135S2 | CM200 (120 kV) | 38,000 | 3 | 1.8 | 8,224 | Bsoft | 10 | 3142 |
| V8-cleaved 135S1 | Tecnai 20 (200 kV) | 50,000 | 20 | 2.7 | 4,381 | CTFMIX | 11 | 3150 |
| V8-cleaved 135S2a | CM200 (120 kV) | 38,000 | 6 | 1.8 | 6,850 | Bsoft | 9 | 3143 |
| V8-cleaved 135S3a | CM200 (120 kV) | 38,000 | 2 | 1.8 | 3,205 | Bsoft | 10 | 3144 |
a
Second V8-cleaved preparation: salt was added when adjusting the concentration (final NaCl concentrations of 0.07 M and 0.5 M, for samples 2 and 3, respectively).
b
FEI, Eindhoven, The Netherlands.
c
Number of particle images used in three-dimensional reconstruction. Corresponding particle images from each micrograph pair are counted as one.
d
CTF correction refers to the program package, either CTFMIX (9) or Bsoft (20), used to apply the correction scheme described in Materials and Methods.
e
Resolution was measured with the Fourier shell correlation criteria (30), 0.3 threshold (27), with images corrected for CTF and decay.
f
Submission number in the Electron Microscopy Data Bank.