Table 1. Comparative Structural Parameters of GO and rGO Derived from XRD Analysis^a.

	peak (002)					peak (100)
sample	2θ [deg]	fwhm [deg]	H [nm]	d[nm]	n	2θ [deg]	fwhm [deg]	D [nm]
GO	10.68	1.10	7.88	0.827	9–10	42.40	1.09	8.5
rGO	25.12	3.14	2.82	0.354	8	42.77	1.74	5.3

^aThe angle of the diffraction peak, represented as 2θ [deg], indicates the crystal orientation. The peak width at half its maximum height denoted as fwhm [deg], is related to the size of the crystallites. The height of the (002) peak, labeled H [nm], can suggest the stack’s thickness. The distance between the crystal layers, shown as d [nm], reveals the spacing within the crystal structure. The parameter “n” estimates the number of layers in the material. Finally, D [nm] refers to the size of the coherent crystalline domains.