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. Author manuscript; available in PMC: 2024 Nov 1.
Published in final edited form as: Epilepsy Behav. 2023 Oct 20;148:109471. doi: 10.1016/j.yebeh.2023.109471

Figure 1. Test-specific impairment rates by ≤ 1.0 and ≤ 1.5 SD cutoffs.

Figure 1.

BNT= Boston Naming Test; ANT: Auditory Naming Test; VNT: Visual Naming Test; WAIS: Wechsler Adult Intelligence Scale; SS: Symbol Search; Cod: Coding; DS: Digit Span; Arith: Arithmetic: Sp= Span; BD: Block Design; MR: Matrix Reasoning; JOLO: Judgement of Line Orientation; RCFT: Rey Complex Figure Test; FRT: Facial Recognition Test; WMS: Wechsler Memory Scale; LM II: Logical Memory delay; VPA II: Verbal Paired Associates delay; AVLT: Rey Auditory Verbal Learning Test; SRT LTR: Buschke Selective Reminding Test Long Term Storage; FP: Family Pictures; VR: Visual Reproductions; LN: Letter Number; WCST-PE: Wisconsin Card Sorting Test- Perseverative Errors