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. Author manuscript; available in PMC: 2024 Nov 1.
Published in final edited form as: Epilepsy Behav. 2023 Oct 20;148:109471. doi: 10.1016/j.yebeh.2023.109471

Figure 3. Comparison of test-specific impairment rates using < 1.5 SD cutoff threshold by epilepsy syndrome (FLE vs. TLE).

Figure 3.

* p < 0.01

BNT= Boston Naming Test; ANT: Auditory Naming Test; WAIS: Wechsler Adult Intelligence Scale; SS: Symbol Search; Cod: Coding; DS: Digit Span; Arith: Arithmetic: Sp= Span; BD: Block Design; MR: Matrix Reasoning; JOLO: Judgement of Line Orientation; WMS: Wechsler Memory Scale; LM II: Logical Memory delay; VPA II: Verbal Paired Associates delay; AVLT: Rey Auditory Verbal Learning Test; FP: Family Pictures; LN: Letter Number; WCST-PE: Wisconsin Card Sorting Test- Perseverative Errors