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. 2024 Sep 24;18(40):27782–27792. doi: 10.1021/acsnano.4c11001

Figure 6.

Figure 6

Postannealed resistivity of smooth (roughness <0.5 nm rms) MgB2 films (y axis) controlled by initial magnesium content in the as-deposited Mg–B composite films (resistivity along the x axis). Reducing the magnesium content (i.e., decreasing the relative RF power on the magnesium target) increases as-deposited resistivity as well as postannealed resistivity by forming boron-rich MgB2 films.