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. 2022 Sep 22;18(44):2204178. doi: 10.1002/smll.202204178

Figure 2.

Figure 2

a) Overview HRSTEM image of the entire Al‐Si1−x Ge x ‐Al heterostructure and b) close‐up view of the metal–semiconductor interface. c) EDX map of the Al‐Si‐Si1−x Ge x junction and d) respective EDX linescan across the abrupt Al‐Si‐Si1−x Ge x and Al‐Si interface. The color coding is carried over from Figure 2c.