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. 2024 Oct 16;14:24294. doi: 10.1038/s41598-024-75576-x

Fig. 8.

Fig. 8

(a) SEM micrograph of sample C after removing one of the junctions by FIB. (b) I-V characteristics before (Loop) and after (Single junction) the removal of one of the junctions measured at Inline graphic. (c) Magnetic field dependence of Inline graphic at Inline graphic before (Loop) and after (Single junction) the removal of one of the junctions.