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. 2024 Oct 16;14:24294. doi: 10.1038/s41598-024-75576-x

Fig. 9.

Fig. 9

SEM micrograph of sample C after fabricating a hole in the center of the remaining junction. (b) Magnetic field dependence of the critical current measured at Inline graphic in the magnetic field range from Inline graphic to Inline graphic. (b) Magnetic field dependence of the critical current measured at Inline graphic plotted from from Inline graphic to -0.6Inline graphic with fitting to model described by Eq. 1.