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. 2024 Oct 16;20:2608–2634. doi: 10.3762/bjoc.20.220

Table 3.

Comparison of microscopy and scattering techniques with advantageous traits highlighted in bold.

microscopy scattering

local structure and detail easily detected details lost
average structure difficult to obtain always obtained
preparation artefacts difficult to prevent none: measurement in-situ
resulting data direct pictures with poor statistics difficult to interpret, good statistics