. Author manuscript; available in PMC: 2024 Oct 23.

Published in final edited form as: IEEE Trans Instrum Meas. 2012 Nov;62(6):10.1109/tim.2012.2225917. doi: 10.1109/tim.2012.2225917

TABLE II.

DoEs With k = 2 Uncertainties U_DoE for Each Resistor for the Three Laboratories Participating in the Low-Ohmic Comparison

No	Nominal Resistance [mΩ]	VSL		NIST		METAS
No	Nominal Resistance [mΩ]	DoE [μΩ/Ω]	U_DoE [μΩ/Ω]	DoE [μΩ/Ω]	U_DoE [μΩ/Ω]	DoE [μΩ/Ω]	U_DoE [μΩ/Ω]
1	100	0.01	0.19	0.05	0.50	−0.10	0.40
4	10	0.02	0.34			−0.03	0.42
5	1	0.10	0.70	−0.15	1.20	−0.11	1.00
6	1	0.10	0.70	−0.25	1.20	−0.04	1.00
7	0.1	0.35	1.32	−0.16	4.00	−0.63	1.82
8	0.1	0.19	1.32	−0.62	4.00	−0.25	1.82
9	0.1	−0.16	1.44	2.05	4.01	−0.27	2.42