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. 2024 Oct 19;14(20):1679. doi: 10.3390/nano14201679

Figure 7.

Figure 7

Stability issue of a-IGZO TFTs. (a) Vth recovery process in dark and light environments. (b,c) Vth variations under PBS and NBS. (d) Vth variations along O ratio under PBS and NBS. (e) Vgs variations under NBIS. The inset shows the time response within 1 s. (f) Transfer characteristic curves of a-IGZO TFTs under NBIS. Notably, the Vth exhibits a two-stage degradation pattern. Initially, there is a positive shift, followed by a negative shift as the stress continues to increase. (a,b) Reprinted from [71,73], Copyright (2010 and 2011) by AIP Publishing. (c–f) Reprinted from [75], [74,76,77], Copyright (2011, 2018, 2019, and 2024) by IEEE.