Table 5.
The atomic percentage of tested materials from XPS spectroscopy.
Atomic (%) | Sample name |
|||
---|---|---|---|---|
Pure Te | Te + Gr | Te + Si + Gr | Te + Si | |
C 1s | 37.18 | 27.13 | 37.05 | 33.23 |
O 1s | 41.75 | 46.43 | 44.54 | 43.48 |
Te 3d | 3.36 | 2.43 | 1.92 | 0.94 |
Si 2p | - | - | 1.23 | 10.99 |
Na1s | 17.71 | 23.18 | 15.27 | 11.36 |