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. 2024 Oct 9;10(20):e39083. doi: 10.1016/j.heliyon.2024.e39083

Table 5.

The atomic percentage of tested materials from XPS spectroscopy.

Atomic (%) Sample name
Pure Te Te + Gr Te + Si + Gr Te + Si
C 1s 37.18 27.13 37.05 33.23
O 1s 41.75 46.43 44.54 43.48
Te 3d 3.36 2.43 1.92 0.94
Si 2p - - 1.23 10.99
Na1s 17.71 23.18 15.27 11.36