Fig. 5. Simultaneous structure analyses of H and D in the 100-nm-thick TiH_0.60D_1.0 nanofilm.

2D mappings of normalized (a) H-NRA and (b) D-NRA yields around the surface normal measured by ¹⁵N²⁺ beam with an energy of 6.45 MeV. Their line profiles of (c) H-NRA and (d) D-NRA yields as a function of θ at various ϕ’s. The error bars represent the statistical uncertainty.