Skip to main content
. 2024 Mar 1:19476035241234315. Online ahead of print. doi: 10.1177/19476035241234315

Figure 4.

Figure 4.

Failure load of 4 different repair devices. The error bars represent standard error for each of the 4 device’s failure load averages. A significant difference between the groups was found (P = 0.034). *Post hoc analysis showed the JuggerStitch failure load was higher than the PEEK all-inside and inside-out (P = 0.005 and P = 0.045, respectively). PEEK = polyether ether ketone–based all-inside device.