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. 2024 Nov 6;15(46):19604–19608. doi: 10.1039/d4sc06012a

Fig. 1. (a) The mechanism of conventional SI-ATRP. Schematic illustrating the mechanism (b) and assembly setup (c) of CuBr-mediated SI-CRP under ambient conditions. (d) AFM image and the corresponding height profile of PSPMA brushes by CuBr-mediated SI-CRP. (e) AFM image (scan area 5 × 5 μm2) of PSPMA brushes.

Fig. 1