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. 2024 Nov 6;15(46):19604–19608. doi: 10.1039/d4sc06012a

Fig. 3. (a) Schematic illustrating in situ chain growth of polymer brushes and preparation of diblock polymer brushes. The height analysis obtained by AFM of homo- (b) and block (c) polymer brushes. (d) Polymer brush thicknesses obtained by CuBr-mediated SI-CRP using CuBr0.1 for 30 min with ionic, (meth)acrylate, acrylamide and hydrophobic monomers. (e) Reusability testing of CuBr0.1 in CuBr-mediated SI-CRP.

Fig. 3