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. 2024 Nov 25;15:10215. doi: 10.1038/s41467-024-54660-w

Fig. 1. Structure and electrical transport of as-grown [(Nd0.8Sr0.2NiO3)m/(SrTiO3)2]10 (Nm/S2) and reduced [(Nd0.8Sr0.2NiO2)m/(SrTiO3)2]10 (R- Nm/S2) nickelate superlattice(SL) films.

Fig. 1

a θ-2θ XRD spectra of as-grown N3/S2 (black), N8/S2 (blue) and reduced R-N3/S2 (red), R-N3/S2 (green). Main and satellite peaks of SLs are numerically identified. b Measured X-ray reflectivity (XRR) and fitted of N8/S2 and R-N8/S2 SLs marked with hollow points and solid lines, respectively. c and d show reciprocal space mapping(RSM) of N8/S2 and R-N8/S2 (103) peaks. The main and satellite peaks corresponding to the XRD pattern are also numerically marked. e Temperature dependence of the resistivity ρ(T) of SLs.