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. 2024 Nov 17;17(22):5613. doi: 10.3390/ma17225613

Figure 5.

Figure 5

TEM-EDS Ti and C mapping of a TiC grain of sample TiC23 after 24h heat treatment (a) Bright-field micrograph of a TiC grain surrounded by Ti grains. (b) C (blue) and Ti (red) EDS mapping for the same region. The black arrow depicts the profile analysed and the average width used in the profile presented in (d). (c) C (blue) and Ti (red) overlay of the TEM lamella with arrows depicting the C and Ti profiles studied. Blue arrows refer to profiles not presented here.