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. 2024 Nov 8;17(22):5460. doi: 10.3390/ma17225460

Figure 1.

Figure 1

(a,b) AFM images of devices A and B, with electrode numbers indicated. The thickness of the Bi2Se3 flakes in devices A and B was measured to be 73 nm and 66 nm, respectively. (c,d) The R(T) curves of devices A and B, measured with an excitation current of 50 nA.