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. 2024 Oct 31;15(11):1348. doi: 10.3390/mi15111348

Figure A3.

Figure A3

Atomic force microscopy of (un)polished MiFDs. (a) Brightfield imaging of the surface and interior of the channel, with 3D surface images by AFM. (b) Roughness (Rq) data comparison of unpolished and polished MiFD surfaces. Statistics with n = 5 each, * p < 0.05 significant difference between unpolished and polished roughness (Rq) in a Student’s t-test.