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. 2024 Nov 11;63(47):22379–22385. doi: 10.1021/acs.inorgchem.4c03021

Figure 1.

Figure 1

Scattered X-ray diffraction intensities of high-pressure monoclinic AgSbO3 (C2/c symmetry) [with AgO and AgSbO3Inline graphic as impurity phases with 0.9 and 0.5 wt %, respectively] at 298 K under ambient conditions as a function of 2θ. The observed pattern (blue circles) measured in Debye–Scherrer geometry, the best combined Rietveld fit profiles (red line), and the difference curves between the observed and calculated profiles (gray line) are shown. The peak positions of the three phases are presented as blue lines below. The square root of the intensity is shown to better visualize the smaller reflections.