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. 2024 Nov 7;14(6):1099–1112. doi: 10.1557/s43579-024-00660-2

Table I.

High-level summary of advantages and disadvantages typically propagated in eNVM reviews, such as Ref. 1.

Feature FRAM PCRAM RRAM MRAM
Endurance High Moderate Moderate Very high
Data retention Moderate Moderate High Moderate
Write speed Fast Moderate Fast Fast
Read speed Fast Moderate Fast Fast
Power consumption Low High Low Moderate
Density Moderate High High Moderate
Cost per bit Moderate Moderate Low High
Fabrication complexity Moderate Moderate Low High
Radiation hardness High High High High

They are generally reflected in the demonstrated performance in Table II, although some of the best performances indicate that many of the gaps between technologies can be closed. Radiation hardness is taken from Ref. 4.