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. 2024 Nov 20;9(48):47506–47518. doi: 10.1021/acsomega.4c06006

Figure 3.

Figure 3

SEM images of the treated Si layer with 30 mJ (a) single pulse and (b) multiple-pulse (100 pulses) and those of the treated Si72Ge28 layer with 30 mJ (c) single pulse and (d) 500 pulses.