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. 2024 Oct 23;11(46):2410114. doi: 10.1002/advs.202410114

Figure 1.

Figure 1

Characteristics of synthesized FeF2. a) Rietveld refinement profile of XRD data (Rp: 7.32, Rexp: 6.39, and Chi2: 2.19). b) HR‐TEM image of FeF2 particle and the inset is the enlarged view of the boxed area. c) SEM image of synthesized FeF2. d) TEM image of a single FeF2 particle. Inset presents an HR‐TEM image of the atomic layers. Elemental EDS mapping for e) Fe and f) F.