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. 2024 Dec 11;636(8042):348–353. doi: 10.1038/s41586-024-08234-x

Extended Data Fig. 6. X-ray diffraction measurements of MnTe epitaxially grown on InP(111)A substrate.

Extended Data Fig. 6

a, 2Theta-Omega scan showing MnTe c-axis (002) peak relative to substrate (111) normal. b, Phi scan centred on MnTe (012), showing six-fold in-plane symmetry corresponding to α-MnTe phase with NiAs structure.