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. 2024 Nov 23;14(23):1884. doi: 10.3390/nano14231884

Figure 5.

Figure 5

I–V characteristic curves measured over 20 consecutive voltage sweeps at Vsw = 0–3 V performed by the (a) dual-sweep mode and the (b) single-sweep mode. Maximum current evolution as a function of nsw for the (c) dual-sweep and (d) single-sweep modes. Retention characteristics at quadruple states demonstrated by changing the (e) magnitude of Vpro and the (f) value of tpro.