Skip to main content
. 2024 Nov 29;14(23):1926. doi: 10.3390/nano14231926

Figure 4.

Figure 4

Transfer yield as a function of (a) the DRL thickness and (b) the curing time, with the corresponding embedding depth indicated on the secondary X-axis above. The error bars in these graphs represent the standard deviations. OM images of (c) the donor substrate before transfer and (d) the receiver substrate after transfer with a 97% transfer yield. The black scale bar corresponds to 100 μm.