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. 2024 Dec 2;16(23):3400. doi: 10.3390/polym16233400

Figure 14.

Figure 14

Images of polytetrafluoroethylene (PTFE) surfaces obtained using atomic force microscopy (AFM). The PTFE surfaces have been treated with a radio frequency plasma torch for different exposure times as indicated in the figure: 0 min (original surface), 2 min, 26 min, and 50 min. The resulting root-mean-square roughnesses are 22 nm, 33 nm, 68 nm, and 150 nm, respectively (adapted from [135]).