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. 2024 Dec 16;14:30477. doi: 10.1038/s41598-024-79518-5

Table 3.

Parameters of system suitability testing of the developed thin layer densitometric method.

Parameters DIP ERG CAF PHEN MEP Reference46
Retardation factor (Rf) 0.06 0.36 0.50 0.86 0.55
Resolution (Rs) 5.00 2.20 5.50 R > 1.5
Retention factor (k) 15.67 1.78 1.00 0.16 0.82
Selectivity (α) 8.80 1.78 6.25 α > 1
Symmetry factor 1.03 1.00 1.02 1.00 1.05 < 1.5