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. 2024 Dec 19;14(54):39921–39926. doi: 10.1039/d4ra07887j

Fig. 2. Microstructure characterization of Bi/CF. (a and b) SEM images. (c) Low and (d) high magnification TEM images. (e) HRTEM and (f) SAED results for Bi/CF. (g–k) The corresponding element mapping of Bi, C, N and O.

Fig. 2