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. 2024 Dec 19;14(54):39954–39967. doi: 10.1039/d4ra05974c

Fig. 4. Contour representations of the variation of (a) JSC, (b) VOC, (c) FF, and (d) PCE of the MoTe2/ZnO device as a function of thickness and defects of the MoTe2 layer. The low to high values of each parameter are indicated by the blue-to-red color coding.

Fig. 4