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. 2024 Dec 9;14:1443303. doi: 10.3389/fonc.2024.1443303

Figure 13.

Figure 13

Scratch Migration Assay in HEK 293 Cells. HEK 293 control (left), HEK 293 ΔSIAE (middle) and HEK 293 ΔCASD1 (right) cells were plated in a 6-well plate IBIDI insert with a 500 µm divider. The divider was carefully removed 12 hours after plating to create a uniform scratch. Cell migration into the scratch area was monitored by imaging every 12 hours over a period of 48 hours. Quantitative analysis of cell migration is presented in.