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. 2024 Dec 30;15:10822. doi: 10.1038/s41467-024-55160-7

Fig. 1. Ferroelectric-/ion-modulated conductive switching in ferroionic CuInP2S6.

Fig. 1

a The schematic of AFM tip/CIPS/Au on SiO2/Si substrate for electrical measurement. b, c Schematic of layered structured CIPS and possible copper positions labeled Cu1, Cu2, and Cu3. d The switching spectroscopy-PFM (SS-PFM) at ambient environment (~26 °C), with a testing time duration of 10 s. e Ten fast scans of I–V curves with a time duration of 1 s for each I–V cycle at ambient temperature. The numbers and arrows represent the bias scanning sequence and direction, respectively. The raw data in (e) is adapted from our previous work16 under a Creative Commons licence CC BY 4.0. f The maximum current change with the cycles in two bias direction according to the results of (e). g The I–V curves measured at 80 °C with a time duration of 1 s (left panel) and PFM phase at different temperature (right panel).