Fig. 3. In situ synchrotron X-ray results for the growth and topotactic reduction of Nd₆Ni₅O₁₆ thin films.

(A) Measurements of the specular rod for 1-, 2-, and 3-UC-thick Nd₆Ni₅O₁₆ films grown on NdGaO₃ substrates. (B) Map of specular rods measured for the 1-UC-thick film at different temperatures in the CaH₂ reducing environment. The arrowed profile at the top shows the shift of the 0024 reflection. The time intervals between each scan are calculated from the start time for each scan, and because the scans themselves require at least 7 to 8 min to process, the actual reduction time may be even shorter. The reduction time is nonlinear and represents the total time starting with the room temperature scan (0 hours).