Skip to main content
. 2025 Jan 2;15:216. doi: 10.1038/s41598-024-84015-w

Table 2.

Components used to fabricate and test the prototype Q4HGC.

Circuit element Device type Part number (specifications)
Switch (S1, S2) MOSFET IRFB4410Z (100 V, 88 A, 8 mΩ)
Switch (S3) MOSFET NTHL041N60S5H (600 V, 57 A, 33 mΩ)
Diodes (D2,D1) Fast recovery diode DSS 16–01 A (100 V, 16 A, 0.64 V)
Diodes (D2,D4, D5,D6) Fast recovery diode MUR1540 (400 V,15 A, 1.05 V)
Diode (D3) Fast recovery diode MUR1520 (200 V, 15 A, 0.85 V)
Diode (D7) Fast recovery diode BYV29X-600 (600 V, 9 A, 1.26 V)
Inductors (L1, L2, L3) Ferrite core PCV2-104–10 L (100 µH, 10 A)
Inductor (L4) Ferrite core PCV2-564–6 L (564 µH, 6 A)
Inductor (L5) Ferrite core PCV2-105–02 L (1 mH, 2 A)
Capacitors (Clift, C2, C3,C4) Polypropylene Film Capacitor (3.3 µF, 250 V)
Capacitor (C0) Electrolytic B43644J65 66M067 (56 µF, 500 V)
Capacitor (C1) Electrolytic EKMG101ELL101MJ20S (100 µF, 100 V)