Fig. 2. (a) Schematic diagram of the optical system used to image the EUV/SXR beam irradiated on an FND film deposited on an ITO-coated glass. (b) Photograph of a prototype of the diamond-based EUV imager (DEUVI). (c) Photograph of an FND thin film deposited on a PET film with a laser-cut crosshair reticle at the disk center. (d) Afterglow measurement for an FND thin film with 50 nm radiation. The light (with intensities in blue) was switched on and off to probe the temporal response of the scintillator.