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. 2024 Dec 11;14(24):1986. doi: 10.3390/nano14241986

Figure 5.

Figure 5

Transmission electron microscopy characterization of TiZrMoC S3, recorded from the area: (a) close to the substrate; (b) close to the surface. Left image: selected area diffraction and identification of diffraction rings attributed to a crystalline structure with fcc; Right image: symmetryTEM image of the coating cross-section. Please note that diffraction is non-uniform, indicating preferential growth.