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. 2025 Jan 10;81(Pt 2):114–119. doi: 10.1107/S2056989025000118

Table 2. Experimental details.

  (I) (II) (III)
Crystal data
Chemical formula C18H15S+·I3 C18H15S+·ClO4 C18H15S+·PF6
M r 644.06 362.81 408.33
Crystal system, space group Monoclinic, P21/n Monoclinic, P21 Monoclinic, P21/n
Temperature (K) 299 100 100
a, b, c (Å) 12.8971 (1), 11.9414 (1), 13.0718 (1) 9.1289 (2), 19.1565 (4), 9.3314 (2) 8.4524 (2), 18.1483 (5), 11.4344 (3)
β (°) 92.374 (1) 90.611 (2) 98.251 (2)
V3) 2011.45 (3) 1631.76 (6) 1735.84 (8)
Z 4 4 4
Radiation type Cu Kα Cu Kα Cu Kα
μ (mm−1) 37.53 3.45 3.10
Crystal size (mm) 0.14 × 0.10 × 0.10 0.18 × 0.17 × 0.13 0.27 × 0.18 × 0.09
 
Data collection
Diffractometer XtaLAB Synergy, Single source at home/near, HyPix3000 XtaLAB Synergy, Single source at home/near, HyPix3000 XtaLAB Synergy, Single source at home/near, HyPix3000
Absorption correction Multi-scan (CrysAlis PRO; Rigaku OD, 2023) Multi-scan (CrysAlis PRO; Rigaku OD, 2023) Multi-scan (CrysAlis PRO; Rigaku OD, 2023)
Tmin, Tmax 0.526, 1.000 0.687, 1.000 0.225, 1.000
No. of measured, independent and observed [I > 2σ(I)] reflections 20556, 3681, 3113 14869, 5850, 5589 8136, 3235, 2782
R int 0.046 0.035 0.038
(sin θ/λ)max−1) 0.603 0.608 0.609
 
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.031, 0.077, 1.06 0.049, 0.138, 1.07 0.057, 0.158, 1.11
No. of reflections 3681 5850 3235
No. of parameters 215 463 250
No. of restraints 0 1 0
H-atom treatment Only H-atom displacement parameters refined Only H-atom displacement parameters refined Only H-atom displacement parameters refined
Δρmax, Δρmin (e Å−3) 0.87, −0.90 0.59, −0.29 1.03, −0.76
Absolute structure Flack x determined using 2436 quotients [(I+)−(I)]/[(I+)+(I)] (Parsons et al., 2013)
Absolute structure parameter 0.005 (16)

Computer programs: CrysAlis PRO (Rigaku OD, 2023), SHELXT2018/2 (Sheldrick, 2015a), SHELXL2018/3 (Sheldrick, 2015b) and OLEX2 (Dolomanov et al., 2009).