Fig. 1. (a) Low and (b) high magnification TEM images of TS-1-E-80-170. TEM images of TS-1-E-80-170 crystallized at 80 °C for 48 h and then at 170 °C for (c) 3 h and (d) 6 h, (e and f) 10 h, and (i and j) 48 h. (g and h) FFT diffractograms of area 1 and area 2 in (f). (k) Low and (l) high magnification TEM images of TS-1-C-80-170 crystallized at 80 °C for 48 h and then at 170 °C for 48 h.
