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. 2025 Feb 17;10(8):8433–8439. doi: 10.1021/acsomega.4c10449

Figure 3.

Figure 3

Material investigation of the integrated Au reference electrode. (A) Optical imaging of the EGFET with an integrated Au reference. Upper part represents the entire EGFET, with the extended gate labeled EG and region for the reference electrode labeled Ref. Dotted square represents the region which is magnified to the lower part. Lower panel shows the magnified integrated Au reference electrode. Asterisk 1 represents the location for energy dispersive X-ray spectroscopy (EDX) analysis in panel B, and asterisk 2 represents the location for EDX in panel C. (B) EDX spectrum analysis for asterisk 1 in panel A. (C) EDX spectrum analysis for asterisk 2 in panel A.