SEM | Scanning electron microscopy |
ΔE | Color changes |
FTIR | Fourier transform infrared spectroscopy |
ATR | Attenuated total reflectance |
NBS | National Bureau of Standards |
Rq | RMS roughness |
Ra | Average roughness |
Rt | Maximum profile height |
SEM | Scanning electron microscopy |
ΔE | Color changes |
FTIR | Fourier transform infrared spectroscopy |
ATR | Attenuated total reflectance |
NBS | National Bureau of Standards |
Rq | RMS roughness |
Ra | Average roughness |
Rt | Maximum profile height |