| SEM | Scanning electron microscopy |
| ΔE | Color changes |
| FTIR | Fourier transform infrared spectroscopy |
| ATR | Attenuated total reflectance |
| NBS | National Bureau of Standards |
| Rq | RMS roughness |
| Ra | Average roughness |
| Rt | Maximum profile height |
| SEM | Scanning electron microscopy |
| ΔE | Color changes |
| FTIR | Fourier transform infrared spectroscopy |
| ATR | Attenuated total reflectance |
| NBS | National Bureau of Standards |
| Rq | RMS roughness |
| Ra | Average roughness |
| Rt | Maximum profile height |