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. 2025 Aug 22;11(34):eadx8890. doi: 10.1126/sciadv.adx8890

Fig. 4. Dynamic evolution of APBs under water vapor oxidation.

Fig. 4.

(A) A high-resolution TEM image capturing the reaction front at an APB. (B) FFT patterns associated with the BM-SCO and IP-SCO regions marked in (A). (C) Inverse FFT corresponding to the red box area in (A). (D) High-resolution TEM image after the reaction interface passes the APB, demonstrating the formation of a defect structure. (E and F) HAADF-STEM image showing the reversible transformation between the generated defect structure, a nanoscale gap, and APB at the atomic scale during oxidation and reduction, respectively. Scale bars, 2 nm. (G) Line intensity profile corresponding to the cyan dashed line in (E) showing the Sr-Sr interatomic distance (~4.7 Å) across the formed defect.