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. 2025 Aug 25;18:41. doi: 10.1007/s40820-025-01891-1

Table 1.

Performance metrics for traditional and high-entropy oxide memristors

Material system   Representative material   Forming-free   ON/OFF ratio   Endurance   Retention   Switching speed/energy   Multilevel states   CMOS compatibility  CMOS Refs.  
Binary-oxides   HfO2   No   ≈103–104 1.2 × 1011 3 × 108 s (ext.) 5 ns/–   24 Yes   [117]
TiO2-C oO   Yes    ~ 103 1 × 103 1 × 104 s –/0.4 V, 2.5 µA (~ 1 µW)   ✓ (via Vstop) Yes   [118]
Perovskites MAPbI3 quantum wires   Yes   1 × 107 6 × 106  > 2 years (ext.)    ~ 100 ps/–   4 Limited   [119]
2D Materials   MoS2  No    ~ 105 104 s   ns/–   5 Limited   [120]
Organic polymers   Hetero-electrolyte polymer No   1 × 103 2 × 102 Limited   [121]
HEOs   (Zr, Hf, Nb, Ta, Mo, W)2O5−x Yes   6–15 7 × 104 7.2 × 104 s 64 Yes   [33]
(Cr, Mn, Fe, Co, Ni)3O4 Yes   1 × 105 4.5 × 103  > 104 s 32 (analog)  Yes   [32]