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. 2025 Aug 29;18(17):4062. doi: 10.3390/ma18174062
PFZs Precipitate-free zones
OM Optical microscopy
SEM Scanning electron microscopy
EBSD Electron backscatter diffraction
TSL Tex Sem Lab
IPF Inverse pole figure
TEM Transmission electron microscopy
BSE Backscattered electron
HABs High-Angle Boundaries
LABs Low-Angle Boundaries
FFT Fast Fourier Transform