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. 2025 Sep 22;18(18):4417. doi: 10.3390/ma18184417
3D-DRAM 3D Dynamic random-access memory
CFET Complementary field effect transistor
GAA Gate-all-around
ICP-RIE Inductively coupled plasma reactive ion etching
MFP Mean free path
ML Multilayer
sccm Standard cubic centimeters per minute
SEM Scanning electron microscopy
XPS X-ray photoelectron spectroscopy