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. 2025 Sep 29;16:8550. doi: 10.1038/s41467-025-63555-3

Fig. 2. Dewetting dynamics and rheology of PNCs.

Fig. 2

a Temporal evolution of dewetting velocity V(tdew)=dRd(tdew) for pure PS and PNC thin films of thickness 207 ± 1 nm dewetted at Tdew = 200 °C for tdew = 200 s. b Complex viscosity (∣η*∣) calculated from melt rheology experiments (Trheo = 200 °C) using oscillatory shear as a function of shear rate. The dotted red line signifies the viscosity at a strain rate = 0.00159 s−1. c Calculated viscosity using equation (2) for the pure PS and PNC thin films dewetted at Tdew = 200 °C is shown as a function of tdew. The horizontal lines in (c) represent time-average viscosity. The error bars in the figure represent the standard deviation of the data. The legends in (b) are also applicable to (a) and (c).