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. Author manuscript; available in PMC: 2025 Oct 15.
Published in final edited form as: IEEE Access. 2025 Jul 28;13:133351–133369. doi: 10.1109/access.2025.3593420

FIGURE 13.

FIGURE 13.

Visualization of two wsis from the artif dataset containing annotated artifacts. The corresponding instance-level ood scores predicted by vaeabmil and masks are shown. Each row corresponds to a different case. It is observed how vaeabmil assigns higher ood scores to the regions identified as artifacts in the mask.