Table I. Frequencies of T-DNA integration by NHR in recombination defective yeast strains.
| Strain | Genotype | Frequency of G418-resistant colonies ± SEM (×10–8)a | Relative frequency of G418-resistant colonies (%)b |
|---|---|---|---|
| YPH250 | WT | 16 ± 9.6 | 100 |
| YPH250rad51 | rad51Δ | 14 ± 7.8 | 88 |
| YPH250rad52 | rad52Δ | 38 ± 8.4c | 238 |
| YPH250yku70 | yku70Δ | <0.0075c | <0.05 |
| YPH250rad50 | rad50Δ | 0.80 ± 0.40c | 5.0 |
| YPH250lig4 | lig4Δ | 0.37 ± 0.36c | 2.3 |
| JKM115 | WT | 1150 ± 0.50 | 100 |
| JKM129 | xrs2Δ | 27 ± 6.0c | 2.3 |
| JKM138 | mre11Δ | 29 ± 3.0c | 2.5 |
| JKM120sir4 | sir4Δ | 15 ± 1.9c | 1.3 |
aAll yeast strains were co-cultivated with LBA1119(pSDM8000). Averages of two or more independent experiments are shown. Frequencies are depicted as the number of G418-resistant colonies divided by the output number of yeast cells (cells/ml). SEM= standard error of the mean.
bThe relative frequency of T-DNA integration by NHR is (frequency in the mutant/frequency in the wild-type (WT)) × 100%.
cThe means of the frequency of G418-resistant colonies seen in the wild-type (WT) and the mutant were tested significantly different in a Student’s t-test (p <0.05).